White Paper: IR Interferometry – How to Choose the Best Interferometer for Your Application

4D Technology interferometers support the precision metrology across the infrared spectrum; from NIR to LWIR

Infrared (IR) imaging is a cornerstone of modern optical systems, playing a vital role across defense, aerospace, and scientific domains. The various IR spectral bands, Near-Infrared (NIR), Short-Wave Infrared (SWIR), Mid-Wave Infrared (MWIR), and Long-Wave Infrared (LWIR), each offer advantages for use in distinct applications.

This white paper helps you answer questions in your IR metrology including:

• Do you really need an IR interferometer?  Or, will a visible system work?
• Surface metrology of optical elements versus transmitted wavefront metrology of optical systems
• When to use a Fizeau interferometer versus a Twyman-Green interferometer

Whether you are evaluating purchasing a system or just want to understand the differences of IR interferometers, this is the paper to download now!