Electronic Speckle Pattern Interferometry with the PhaseCam 6110.
A high-power 532 nm external source adds ESPI capability to the compact, versatile PhaseCam 6110.
PhaseCam ESPI Specs
|Acquisition||Electronic Speckle Pattern Interferometry|
|Camera||Single camera, high-speed|
|Power||< 18W with High Power Source Module|
|Camera||High res 4MP, 12-bit|
|Controls||Motorized focus, beam blocks, contrast|
|Software||4Sight™ Focus included|
|Size||PhaseCam 6110 Measurement head < 39 cm (15.3 in) long|
Electronic Speckle Pattern Interferometry makes it possible to measure the change in shape of structures with diffuse surfaces.
the PhaseCam® ESPI includes a high power, 532 nm external source to measure the deformations of the entire surface simultaneously, without attaching auxiliary optics to the test article.
The PhaseCam 6110 interferometer is compact, lightweight, vibration-immune, and only 13 inches in length. A high resolution 4MP imaging sensor and motorized controls make it ideal for measuring large surfaces over long stand-off distances, in noisy or vibration-rich environments.
The PhaseCam 6110 dynamic laser interferometer incorporates a high-speed optical phase sensor that makes wavefront measurements in as little as 30 microseconds—over 5000 times faster than a phase shifting interferometer. Such short acquisition time means the PhaseCam can be used in the noisiest environments, without vibration isolation or turbulence control. Applications include measurement of large, focal optical systems such as concave telescope mirrors and lens systems, as well as deformable mirrors and adaptive optics.
30 microsecond data acquisition time
High Power Source
Provides Sufficient illumination to measure very large, diffuse structures.
Compact and Lightweight
Designed with performance and remote measurement in mind. Small, lightweight, easy to mount and reposition quickly.
Data analysis and visualization
Highly developed data analysis software and controlling computer provided