Surface Isolation Source for measuring plane-parallel optics.
Measure one or both surfaces of a transparent optic—without coating the surfaces. Transmitted wavefront error, optical thickness and homogeneity can be calculated, even on thinner materials.
AccuFiz SIS Specs
|For use with||AccuFiz Fizeau interferometers|
|Source||Fiber-coupled short coherence|
|Wavelength||635-640 nm diode|
|Output Power||1–3 mW|
|Software||4Sight™ Focus included|
|Size||38.1 cm (15 in) long|
|Reflectivities||1 – 100% (attenuation required)|
Plane-parallel optics are transparent components with parallel faces, or systems with two or more parallel surfaces. Measuring any one surface with an interferometer is extremely difficult or impossible, as all parallel surfaces contribute fringes to the interferogram.
4D’s Surface Isolation Source is an optional, external laser source that excludes all but the surface of interest. The SIS module lets you measure both surfaces of a transparent optic with a standard AccuFiz interferometer. You can also calculate transmitted wavefront error, optical thickness and homogeneity, all from a single measurement setup.
The adjustable path match mechanism provides flexibility, letting you dial in any surface that is within 88 through 112 millimeters from the aperture.
Fizeaus and optical production
AccuFiz Fizeaus are well suited to optics manufacturing.
- Qualify shape and mid-spatial frequencies
- Measure flats, spheres, cubes and mirrors
- Wavefront transmission quality measurements
- Fast and precise
- Use in Aerospace, Semiconductor and Optics industries